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HTS Code

9031.49.70.00

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

Tariff Details
HS Code
9031.49.70.00
Description
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
General Duty Rate
Free
Unit of Quantity
No.
Section
Section 18
Last Updated
February 7, 2026
Additional Tariff Rates
Section 301 (China)
+25%
Reciprocal Tariff
+10%

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